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FAL is made from high-purity aluminum oxide. Under extremely strict temperature control and quality management, the material achieves extremely high purity and a unique crystal form.

The FM series is suitable for fine polishing of various metal materials, from high-speed tools to various soft metals. Its special manufacturing process results in a unique grain shape and a highly concentrated and uniform grain size distribution, meeting stringent polishing requirements. It is suitable for polishing materials with a Vickers hardness of 200-250, achieving perfect polishing results even after rough polishing on an abrasive-coated polishing belt followed immediately by fine polishing.

FM also avoids some inherent defects of general mechanical polishing. If the workpiece is made of high-speed steel or other alloys requiring sharp edges, FM ensures that its delicate sharp areas are not damaged. FM also ensures that trace impurities with special functions in the workpiece remain unchanged, such as the graphite content in cast steel, maintaining the designed brittle phase of these metals—something that conventional polishing methods have not yet achieved. No special media is required for FM application; a regular wool pad is sufficient.

FS is made from high-purity oxide (over 99.9%) and is currently widely used in the final polishing of eyeglasses and the machining of extremely precise mechanical parts. Its crystal form and grain size are achieved under extremely strict control, ensuring that both grinding rate and surface finish of the processed products meet user requirements.

The main components of FZ-05 and FZ-02 are ultra-fine alumina abrasive particles, suitable for special metals such as platinum, chromium, nickel, and their alloys. Using FZ with hard polyurethane polishing pads and polishing asphalt can achieve a deep, scratch-free, mirror-like metallic luster. FZ-02 can also be used for the final polishing of optical lenses, achieving a scratch-free, uneven surface and a clear, ripple-free image under optical interferometer conditions.